Alexandria Digital Research Library

Improving Validation Coverage Metrics to Account for Limited Observability

Author:
Lisherness, Peter
Degree Grantor:
University of California, Santa Barbara. Electrical & Computer Engineering
Degree Supervisor:
K. T. Cheng
Place of Publication:
[Santa Barbara, Calif.]
Publisher:
University of California, Santa Barbara
Creation Date:
2012
Issued Date:
2012
Topics:
Engineering, Computer
Genres:
Dissertations, Academic and Online resources
Dissertation:
Ph.D.--University of California, Santa Barbara, 2012
Description:

In both pre-silicon and post-silicon validation, the detection of design errors requires both stimulus capable of activating the errors and checkers capable of detecting the behavior as erroneous. Most functional and code coverage metrics evaluate only the activation component of the testbench and ignore propagation and detection. In this document, we describe our innovations in developing improved metrics that account for propagation and/or detection of design errors.

These techniques represent a significant improvement to the validation process, which for years has been the dominant portion of chip design costs. Their application can reduce both the computational complexity as well as the manual effort required for validation, all while facilitating a higher standard of quality than previous methods.

Physical Description:
1 online resource (127 pages)
Format:
Text
Collection(s):
UCSB electronic theses and dissertations
ARK:
ark:/48907/f3ft8j0r
ISBN:
9781267767707
Catalog System Number:
990039147790203776
Rights:
Inc.icon only.dark In Copyright
Copyright Holder:
Peter Lisherness
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